YB3116数字集成电路测试仪产品介绍（中文版）
YB3116数字集成电路测试仪是一款专业级电子元器件检测设备，专为数字集成电路的功能验证与参数分析而设计。本设备采用模块化架构与智能化检测技术，能够快速完成74/54系列、4000系列等主流数字逻辑器件的功能测试，适用于电子研发实验室、教学实训中心及电子维修领域。
设备配备24通道可编程测试接口，支持TTL、CMOS等多种逻辑电平的自动匹配功能，最高测试频率可达25MHz。通过高精度电压测量模块，可实时监测器件供电电流（范围0-50mA，分辨率1μA）及输入输出电压特性（范围0-5V，精度±0.5%）。独创的三阶信号驱动技术有效提升测试稳定性，确保在高低温环境（工作温度-10℃~60℃）下的测试可靠性。
人性化操作界面配备4.3英寸彩色触控屏，支持离线测试模式与自动测试序列编程。内置器件数据库包含300+标准型号参数模板，用户可通过USB接口进行数据库扩展更新。独创的故障诊断系统能自动生成测试报告，标注异常管脚位置及参数偏差值，显著提升故障定位效率。设备配置标准JTAG接口，支持与PC端分析软件的数据交互，实现测试波形的实时观测与存储。
本产品采用军工级PCB制造工艺，关键电路配备多重电磁屏蔽设计，平均无故障工作时间（MTBF）超过10,000小时。紧凑型金属机身（尺寸320×220×85mm）配合便携式提手设计，适用于移动检测场景。智能温控风扇系统在保证散热效率的同时将工作噪音控制在40dB以下，创造安静的操作环境。
YB3116测试仪广泛应用于工业控制板卡检测、通信设备维护、汽车电子诊断等领域，其高效的测试能力与稳定的性能表现，已成为电子工程师进行数字电路调试、教学演示和产品质检的优选工具。
YB3116 Digital IC Tester Product Introduction (English Version)
The YB3116 Digital Integrated Circuit Tester is a professional-grade electronic component testing device specifically designed for functional verification and parametric analysis of digital ICs. Featuring modular architecture and intelligent detection technology, this equipment efficiently tests mainstream digital logic devices including 74/54 series and 4000 series components, making it ideal for electronics R&D laboratories, technical training centers, and equipment maintenance applications.
Equipped with 24 programmable test channels, the tester automatically adapts to TTL and CMOS logic levels with a maximum testing frequency of 25MHz. Its precision voltage measurement module monitors power supply current (0-50mA range, 1μA resolution) and I/O voltage characteristics (0-5V range, ±0.5% accuracy) in real-time. The proprietary three-stage signal drive technology ensures stable operation across temperature variations (-10℃ to 60℃).
The user-friendly interface incorporates a 4.3-inch color touchscreen supporting offline testing and automated test sequence programming. With a built-in database containing 300+ standard device profiles, users can expand device libraries via USB connectivity. The intelligent fault diagnosis system generates detailed reports highlighting defective pins and parameter deviations, significantly improving troubleshooting efficiency. Standard JTAG interface enables seamless data exchange with PC analysis software for real-time waveform monitoring and storage.
Constructed with military-grade PCB manufacturing standards, critical circuits feature multi-layer EMI shielding, achieving a mean time between failures (MTBF) exceeding 10,000 hours. The compact metal chassis (320×220×85mm) with carrying handle design ensures portability for field service applications. An adaptive thermal management system maintains optimal operating temperatures while keeping noise levels below 40dB.
Widely adopted in industrial control board verification, communication equipment maintenance, and automotive electronics diagnostics, the YB3116 tester has become a preferred solution for electronic engineers engaged in circuit debugging, technical demonstrations, and product quality inspection due to its reliable performance and efficient testing capabilities.
