YB3116A集成电路测试器
YB3116A集成电路测试器产品介绍（中文）
YB3116A是一款专业用于数字集成电路功能检测的仪器设备，适用于科研机构、电子制造业及教育领域的集成电路性能验证工作。该设备采用模块化设计，可支持TTL 54/74系列、55/75系列、CMOS 4000/4500系列以及常见RAM、EPROM存储器芯片的测试，同时兼容CPU接口电路和光电耦合器件等多种数字元件的功能诊断。测试系统通过继电器矩阵实现多通道切换，具备8种可调电源参数、多种负载电流选择及功耗测试功能，支持全中文操作界面和自动型号识别。整机采用紧凑型设计（100×220×350mm），重量约2.5kg，便于实验室或生产现场使用。其特色功能包括智能程序调试、EPROM数据复制修改组合等，为电子设备维修和教学实验提供高效测试方案。139
YB3116A IC Tester Product Introduction (English)
The YB3116A is a digital integrated circuit testing instrument designed for functional verification of logic devices in R&D, manufacturing and educational scenarios. Featuring a slot-based architecture with 10 universal slots, it supports comprehensive testing of TTL 54/74 series, 55/75 series, CMOS 4000/4500 series ICs, along with common memory chips including RAM and EPROM. The system integrates PCI interface for PC connectivity, allowing automated testing procedures through relay matrix channel switching. With adjustable power supplies (8 voltage options), configurable load currents and power consumption measurement, it provides parameter comparison and fault diagnosis capabilities. The compact chassis (100H×220W×350D) houses intuitive Chinese/English menu-driven controls, supporting features like EPROM data manipulation and microcontroller peripheral circuit testing. Ideal for production line QA checks and electronics engineering labs, it balances portability with versatile testing coverage. 2512
技术特点补充说明
设备采用动态测试方法，可捕捉瞬态信号异常，内置的智能算法能自动匹配器件标准参数并进行偏差分析。测试内容覆盖输入输出特性、传输延迟和噪声容限等关键指标，对于混合信号器件提供专用测试模式。用户可通过历史数据对比功能追踪器件性能变化趋势，配套软件支持测试报告生成和数据导出。特殊设计的DUT接口适配器兼容DIP/SOP封装，确保测试接触可靠性。4613
Enhanced Technical Features
The testing platform employs real-time signal sampling technology to capture glitches and timing violations, with built-in self-calibration routines ensuring measurement consistency. Advanced features include programmable test sequences for batch testing, pulse width analysis for clock-dependent devices, and leakage current measurement for quality screening. The thermal-compensated circuitry maintains accuracy across 0-40°C operating range, while the ergonomic front panel provides direct access to frequency/voltage adjustment controls. Optional accessories extend testing capability to programmable logic devices and LED display drivers. 71115
简单介绍
各种智能仪器程序的复制、保存：中小规模程序的调试：EPROM、E。PROM器件的复制、修改、组合：检验新购器件的质量：测试内容丰富：YB3116A 集成电路测试器
YB3116A 集成电路测试器
的详细介绍
各种智能仪器程序的复制、保存：
中小规模程序的调试：
EPROM、E。PROM器件的复制、修改、组合：
检验新购器件的质量：
测试内容丰富：
体积小、重量轻、性价比高。 |
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YB3116A
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| ·可测试TTL74/54、55/75、CMOS40、45、14系列 |
| ·常用RAM、EPROM、E^2PROM、光电耦合器、单片机系列 |
| ·常用微机外围电路系列、LED显示器系列 |
| ·外形尺寸：100H×220W×350D(mm) |
| ·质量：约2.5kg |
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