【产品中文介绍】
WZP-6312AB薄膜铂热电阻是现代工业温度检测领域的创新型解决方案，采用精密薄膜溅射技术制造的铂电阻元件，在-50℃至500℃宽温域范围内提供稳定可靠的温度测量服务。其独有的多层复合结构设计，通过氧化铝陶瓷基片与真空镀膜工艺的完美结合，显著提升了产品的抗振动性能和环境耐受性。
该产品核心元件选用高纯度铂金属材料（Pt100），配合自主设计的微型化传感结构，实现了0.15%的测量精度等级。特殊设计的304不锈钢防护壳体经过精密激光焊接工艺处理，可在IP67防护等级下有效抵御粉尘侵入和液体渗透。为适应不同工业场景需求，提供M8/M12标准螺纹接口、法兰安装等多种机械配置，并支持定制化引线长度（默认配置1.5米双层屏蔽线缆）。
在过程控制领域展现出色性能，其0.3秒的快速响应特性可精准捕捉温度瞬变，多层钝化处理工艺确保在85%RH湿度环境下长期稳定工作。产品线配置丰富的探头尺寸选项（直径3mm至8mm），配合可选的高温型陶瓷封装方案，满足从实验室精密设备到工业窑炉等不同场景的应用需求。建议用户根据实际介质特性选择匹配的防护套管材质，并定期进行零点校准以获得最佳测量效果。
【Product Introduction in English】
The WZP-6312AB thin-film platinum RTD represents an advanced temperature sensing solution for modern industrial applications. Utilizing magnetron sputtering technology, this sensor delivers precise temperature measurement across a broad operational range from -50℃ to 500℃. Its multi-layer composite structure, combining alumina ceramic substrates with vacuum-deposited thin-film technology, ensures exceptional resistance to mechanical stress and environmental challenges.
Featuring high-purity platinum sensing elements (Pt100) in a micro-engineered configuration, the device achieves measurement accuracy within ±0.15%. The hermetically sealed 304 stainless steel housing with laser-welded construction provides reliable IP67 protection against particulate and liquid ingress. Multiple mechanical configurations including M8/M12 threaded connections and flange mounting options are available, complemented by standard 1.5-meter dual-shielded cabling with customizable length options.
Engineered for dynamic process control applications, the sensor demonstrates rapid response characteristics with 0.3s thermal time constant. Advanced passivation layers maintain measurement stability under 85%RH humidity conditions. Comprehensive probe dimensions ranging from 3mm to 8mm diameter accommodate diverse installation requirements, with optional high-temperature ceramic encapsulation for extreme thermal environments. Optimal performance is achieved through proper selection of protective sheathing materials based on medium characteristics, accompanied by periodic baseline calibration procedures.
