【产品中文介绍】
YB4813半导体特性图示仪是一款专业用于半导体器件特性分析的高精度测试设备。该仪器采用先进的测量技术,能够精准捕捉二极管、晶体管、场效应管、可控硅等多种半导体元器件的电压-电流(V-I)特性曲线,为研发、生产及质量控制环节提供可靠数据支持。
本设备集成多参数测试功能,支持静态参数(如击穿电压、饱和电流)和动态特性(如跨导、输出电容)的同步检测,搭配智能化的图形化操作界面,用户可通过触控屏幕直观调整测试参数并实时观测曲线变化。仪器内置多种预置测试模式,支持自定义测试模板功能,显著提升复杂器件的测试效率。
在硬件设计方面,YB4813采用模块化架构,配备高稳定性信号源与低噪声采集系统,确保在宽量程范围内(电压0-3kV/电流0-40A)仍能保持0.1%的基础测量精度。独特的温漂补偿技术有效降低环境温度对测试结果的影响,满足工业级实验室对设备长期稳定性的严苛要求。
该产品广泛应用于半导体器件制造、电源模块开发、新能源汽车电子系统检测等领域,特别适用于第三代半导体材料(如SiC、GaN)器件的特性分析。设备支持数据导出与远程控制功能,可无缝对接自动化测试系统,助力企业实现智能化产线升级。
我们致力于为客户提供高性价比的测试解决方案,YB4813系列以优异的性能表现和灵活的系统扩展能力,成为工程师进行半导体特性研究的理想工具。
【Product Introduction in English】
The YB4813 Semiconductor Curve Tracer is a precision testing instrument designed for comprehensive characterization of semiconductor devices. Utilizing cutting-edge measurement technology, it accurately captures voltage-current (V-I) characteristics of various components including diodes, transistors, MOSFETs, and thyristors, delivering reliable data support for R&D, manufacturing, and quality control processes.
Equipped with multi-parameter testing capabilities, this instrument enables simultaneous measurement of static parameters (breakdown voltage, saturation current) and dynamic characteristics (transconductance, output capacitance). The user-friendly touchscreen interface allows real-time curve observation and parameter adjustment, while pre-configured test modes and customizable templates significantly enhance testing efficiency for complex devices.
The YB4813 features a modular hardware architecture with high-stability signal sources and low-noise acquisition systems, achieving 0.1% baseline accuracy across wide measurement ranges (0-3kV voltage, 0-40A current). Its proprietary temperature drift compensation technology minimizes environmental impacts, ensuring consistent performance in industrial laboratory environments.
Ideal for semiconductor manufacturing, power module development, and automotive electronics validation, this instrument excels in analyzing wide-bandgap semiconductor materials (SiC, GaN). With data export and remote control capabilities, it seamlessly integrates into automated test systems, supporting smart factory initiatives.
Combining cost-effectiveness with operational flexibility, the YB4813 series offers engineers a powerful solution for advanced semiconductor research, backed by responsive technical support and adaptable system configurations to meet evolving industry demands.