供应 YB-3114在线/离线集成电路测试器
产品概述
YB-3114在线/离线集成电路测试器是一款功能强大的测试设备,适用于多种数字集成电路的功能测试。该设备支持TTL、CMOS、GAL、RAM、EPROM、CPU及可编程器件的测试,能够满足实验室、生产线和维修场景的需求。采用中文Windows操作平台,用户界面友好,支持开放式自建芯片和数据库,方便用户根据实际需求进行定制化测试。测试结果显示方式多样,包括图形显示(时序波形)和状态显示,帮助用户快速准确判断测试结果。1
核心功能
该测试器具备V-I特性曲线测试功能,能够对100脚以下的芯片进行高效测试,每引脚最大输出电流达100mA,测试速度可达500kHz/Pin。设备采用模块化设计,兼容台式电脑和笔记本电脑,外形尺寸为90H×350W×350D(mm),质量约4.7kg,便于移动和部署。工作环境要求为0°C~30°C,工作湿度不超过75%,功耗约45W(不包括待测板功耗),工作电压220V±10%,适合大多数电子测试环境。13
技术优势
YB-3114测试器采用先进的图形化显示技术,可直观呈现测试波形和状态信息,大大提升了测试效率和准确性。设备支持在线和离线两种测试模式,在线测试时无需将芯片从电路板上取下,简化了测试流程。自适应测试功能使其能够准确判断各类集成电路的工作状态,相比传统测试方法具有明显优势。测试数据库可自由扩充,用户可根据需要添加新的芯片测试参数,满足不断变化的测试需求。26
应用场景
本产品广泛应用于电子制造、科研机构、教育实验和质量控制等领域。在生产线测试环节,可快速检测集成电路的功能完整性;在维修维护工作中,能准确诊断故障芯片;在教学实验中,帮助学生理解集成电路的工作原理。设备操作简单,学习曲线平缓,即使是初学者也能快速掌握基本测试方法。48
Product Overview
The YB-3114 In-Circuit/Off-Circuit IC Tester is a versatile testing device designed for functional verification of various digital integrated circuits. It supports testing of TTL, CMOS, GAL, RAM, EPROM, CPU and programmable devices, making it suitable for laboratory, production line and maintenance applications. Featuring a Chinese Windows operating platform, the user-friendly interface allows open creation of chip libraries and databases for customized testing requirements. Test results can be displayed in graphical waveforms or status formats for quick and accurate evaluation.1
Key Features
This tester incorporates V-I characteristic curve testing capability, efficiently handling chips with up to 100 pins. With maximum output current of 100mA per pin and testing speed reaching 500kHz/Pin, it delivers reliable performance. The modular design is compatible with both desktop and laptop computers, measuring 90H×350W×350D(mm) and weighing approximately 4.7kg for easy portability. Operating conditions include temperature range of 0°C~30°C, humidity below 75% RH, power consumption around 45W (excluding power for test boards), and 220V±10% power supply, suitable for most electronic testing environments.13
Technical Advantages
The YB-3114 tester utilizes advanced graphical display technology to visually present test waveforms and status information, significantly improving testing efficiency and accuracy. Both in-circuit and off-circuit testing modes are supported, with in-circuit testing eliminating the need to remove chips from circuit boards. Its adaptive testing function provides precise evaluation of various IC working states, outperforming traditional testing methods. The expandable test database allows users to add new chip parameters as needed, accommodating evolving testing requirements.26
Applications
This product finds extensive applications in electronics manufacturing, research institutions, educational laboratories and quality control processes. On production lines, it enables rapid verification of IC functionality; during maintenance work, it helps accurately diagnose faulty chips; in teaching experiments, it assists students in understanding IC operation principles. With straightforward operation and gentle learning curve, even beginners can quickly master basic testing procedures.48
简单介绍
YB3117配台式电脑 YB3118配笔记本电脑 外形尺寸 90H×350W×350D(mm) 质量 约4.7kg YB3114在线/离线集成电路测试器
YB3114在线/离线集成电路测试器
的详细介绍
大测试引脚数100:
中文Windows操作平台:
开放式自建芯片和数据库。 |
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YB3117/YB3118
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测试种类 |
可测试TTL、CMOS、GAL、RAM、EPROM、CPU及可编程器件 |
显示方式 |
图形显示(时序显示)、状态显示 |
被测芯片脚数 |
100脚以下 |
大输出电流 |
每引脚100mA |
测试速度 |
500kHz/Pin |
中文Windows操作平台 |
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开放式自建芯片的数据库 |
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V-1特性曲线测试 |
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工作温度 |
0°C~30°C |
工作湿度 |
75% |
功耗 |
约45W(不包括供待测板的功耗) |
工作电压 |
220V±10% |
YB3117配台式电脑 |
YB3118配笔记本电脑 |
外形尺寸 |
90H×350W×350D(mm) |
质量 |
约4.7kg |
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